P-DOPING OF GROUP III-NITRIDE BUFFER LAYER STRUCTURE ON A HETEROSUBSTRATE
The invention relates to an epitaxial group-III-nitride buffer-layer structure (100) on a heterosubstrate, wherein the buffer-layer structure (100) comprises at least one stress-management layer sequence S including an interlayer structure (530) arranged between and adjacent to a first and a second...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | The invention relates to an epitaxial group-III-nitride buffer-layer structure (100) on a heterosubstrate, wherein the buffer-layer structure (100) comprises at least one stress-management layer sequence S including an interlayer structure (530) arranged between and adjacent to a first and a second group-III-nitride layer (120, 140), wherein the interlayer structure (530) comprises a group-III-nitride interlayer material having a larger band gap than the materials of the first and second group-III-nitride layers (120, 140), and wherein a p-type-dopant-concentration profile drops, starting from at least 1x1018cm-3, by at least a factor of two in transition from the interlayer structure (530) to the first and second group-III-nitride layers (120, 140). |
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