MEASUREMENT DEVICE

Provided is a measurement device that is highly accurate due to an optical configuration. The following are provided: a pattern projector that projects an optical pattern; and a pattern image receiver that receives the optical pattern which was projected. The pattern image receiver includes: a patte...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	SUGIHARA, Hiroaki
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	GYROSCOPIC INSTRUMENTS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING DISTANCES, LEVELS OR BEARINGS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS NAVIGATION PHOTOGRAMMETRY OR VIDEOGRAMMETRY PHYSICS SURVEYING TESTING
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Beschreibung
Zusammenfassung:	Provided is a measurement device that is highly accurate due to an optical configuration. The following are provided: a pattern projector that projects an optical pattern; and a pattern image receiver that receives the optical pattern which was projected. The pattern image receiver includes: a pattern image pickup unit that picks up an image of the optical pattern and converts the same to image pickup data; and a point coordinate value calculation unit that, on the basis of the converted image pickup data, calculates a 3D coordinate value for the position of the image pickup unit or a position known from the image pickup unit.