MULTI-RESOLUTION DETECTORS FOR MEASURING AND CONTROLLING A CHARGED PARTICLE PENCIL BEAM

A multi-resolution detector includes a high-resolution pixelated electrode and a low-resolution pixelated electrode. The high-resolution pixelated electrode includes a plurality of sub-arrays of first pixels. Each respective first pixel at each relative position in each sub-array is electrically con...

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Bibliographische Detailangaben
Hauptverfasser: DART, ANDREW, GORDON, JOHN, BOISSEAU, PAUL R, OTA, KAN
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:A multi-resolution detector includes a high-resolution pixelated electrode and a low-resolution pixelated electrode. The high-resolution pixelated electrode includes a plurality of sub-arrays of first pixels. Each respective first pixel at each relative position in each sub-array is electrically connected in parallel with one another. The low-resolution pixelated electrode includes a plurality of second pixels. A control system receives as inputs an output from each pixelated detector. The control system uses the inputs to determine a physical position and a transverse intensity distribution of an incident charged particle pencil beam at the resolution of the high-resolution pixelated electrode.