RAY FILTER AND DUAL-ENERGY X-RAY INSPECTION SYSTEM

RAY FILTER AND DUAL-ENERGY X-RAY INSPECTION SYSTEM

The present disclosure provides a ray filter (10). The ray filter is arranged in front of an X-ray source and is switchable between a first state where the ray filter is configured to allow the high-energy X-rays and the low-energy X-rays to pass therethrough and a second state where the ray filter...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: CHEN, Yumei, LIU, Yaohong, YIN, Wei, YAN, Xinshui, KANG, Kejun, GUAN, Weiqiang
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
GAMMA RAY OR X-RAY MICROSCOPES
IRRADIATION DEVICES
NUCLEAR ENGINEERING
NUCLEAR PHYSICS
PHYSICS
TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:The present disclosure provides a ray filter (10). The ray filter is arranged in front of an X-ray source and is switchable between a first state where the ray filter is configured to allow the high-energy X-rays and the low-energy X-rays to pass therethrough and a second state where the ray filter is configured to only allow the high-energy X-rays to pass therethrough. The present disclosure further provides a dual-energy X ray inspection system comprising a dual-energy X-ray source and the ray filter. The ray filter of the present disclosure has a small volume, a simple configuration, and is easily applicable to the dual-energy X ray inspection system without changing arrangement of the inspection system.