Method and system for performing electrical tests to complex devices
Method and system for performing electrical tests to complex devices. The method comprises: a first stage (31) that includes generating a model of the device (11) in a digital electronic circuits description language based on stimuli transfer, preparing a stimulus vector and simulating said model wi...
Gespeichert in:
Hauptverfasser: | , , , , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Method and system for performing electrical tests to complex devices. The method comprises: a first stage (31) that includes generating a model of the device (11) in a digital electronic circuits description language based on stimuli transfer, preparing a stimulus vector and simulating said model with said stimulus vector for obtaining the continuity and insulation test program to be performed to the device (11); a second stage (33) where the device (11) is connected to a workbench formed by an electrical testing machine (13) and a matrix switch (15) by means of a connection interface (17); and a third stage (35) where said test program to the device (11) is executed. The system comprises said workbench and a computer system (19) with a software adapted to execute the method. |
---|