INSPECTION DEVICE

The invention provides an inspection apparatus capable of preventing a conforming article from being judged as nonconforming when inspecting a molded object for acceptability by performing image processing on an image captured of the inspection object. The apparatus includes a model pattern position...

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Bibliographische Detailangaben
1. Verfasser: FUJISAWA YOSHITAKA
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:The invention provides an inspection apparatus capable of preventing a conforming article from being judged as nonconforming when inspecting a molded object for acceptability by performing image processing on an image captured of the inspection object. The apparatus includes a model pattern positioning means (15) for positioning a model pattern (M) in a position with a highest degree of agreement by matching the model pattern (M) against the image captured of the inspection object, a model pattern dividing means (16) for dividing the model pattern (M) into a plurality of elements in such a manner as to have mutually overlapping regions (D), and a shape recognition means (17) for recognizing a shape corresponding to the model pattern (M) by positioning each of the elements divided by the model pattern dividing means (16) in a position with a highest degree of agreement by performing pattern matching within a predetermined range with reference to the position where the model pattern (M) has been positioned on the image.