X-RAY CT INSPECTION SYSTEM, IN PARTICULAR FOR INSPECTING OBJECTS

An x-ray inspection system (1) for the non-destructive inspection of objects having at least two x-ray radiation sources (7, 9) which can rotate about an axis of rotation (5) in a plane of rotation and each generate a beam bundle (17, 19) establishing an examination region (21), wherein a conveying...

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Bibliographische Detailangaben
Hauptverfasser: HENKEL, Rainer, HARTICK, Martin
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:An x-ray inspection system (1) for the non-destructive inspection of objects having at least two x-ray radiation sources (7, 9) which can rotate about an axis of rotation (5) in a plane of rotation and each generate a beam bundle (17, 19) establishing an examination region (21), wherein a conveying direction (z) for an inspection object extends substantially perpendicularly to the plane of rotation. The x-ray inspection system also has a detector unit (25) which has detector elements (27; 27a, 27b) for x-ray beams and is arranged opposite the at least two x-ray radiation sources (7, 9). A gap (28) is provided between each of the detector elements (27; 27a, 27b) adjacent in the circumferential direction of the plane of rotation, said detector elements being spaced apart by a first distance D1, and a ratio D1/B of the first distance D1 to a width B of a detector element (27; 27a, 27b) is more than 100% and at most 250%.