TESTING DEVICE FOR A SCATTERED-LIGHT MEASURING DEVICE, PRODUCTION METHOD FOR A TESTING DEVICE FOR A SCATTERED-LIGHT MEASURING DEVICE, AND METHOD FOR CHECKING A SCATTERED-LIGHT MEASURING DEVICE
The invention relates to a testing device (10) for a scattered-light measuring device, said testing device comprising a light-transmissive body (20), which can be arranged in a measurement chamber (16) of the scattered-light measuring device and comprises a plurality of scattering centres (22), by m...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | The invention relates to a testing device (10) for a scattered-light measuring device, said testing device comprising a light-transmissive body (20), which can be arranged in a measurement chamber (16) of the scattered-light measuring device and comprises a plurality of scattering centres (22), by means of which a light (14) emitted by a light source (12) of the scattered-light measuring device can be scattered, wherein the scattering centres (22) are present in a scattering body segment (24) of the light-transmissive body (20), which scattering body segment is arranged between an upstream region (26) of the light-transmissive body (20) and a downstream region (28) of the light-transmissive body (20), and wherein the upstream region (26) and the downstream region (28) are each free of the scattering centres (22). The invention further relates to a production method for a testing device for a scattered-light measuring device. The invention further relates to a method for checking a scattered-light measuring device. |
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