DISPERSION CORRECTION IN OPTICAL FREQUENCY-DOMAIN REFLECTOMETRY

An optical frequency domain reflectometry (OFDR) measurement is produced from an OFDR apparatus that includes a tunable laser source coupled to a sensing interferometer and a monitor interferometer. The sensing interferometer is also coupled to a waveguide, e.g., an optical sensing fiber. Sensor int...

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Bibliographische Detailangaben
Hauptverfasser:	LALLY, Evan, M, FROGGATT, Mark, E, KLEIN, Justin, W, Templeton, Emily, E. H
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	An optical frequency domain reflectometry (OFDR) measurement is produced from an OFDR apparatus that includes a tunable laser source coupled to a sensing interferometer and a monitor interferometer. The sensing interferometer is also coupled to a waveguide, e.g., an optical sensing fiber. Sensor interferometric data obtained by the OFDR measurement is processed in the spectral domain (e.g., frequency) with one or more parameters to compensate for the optical dispersion associated with the sensing interferometer data. A Fourier Transform of the dispersion-compensated sensing interferometric data in the spectral domain is performed to provide a dispersion-compensated OFDR measurement information in the temporal (e.g., time) domain.