A CIRCUIT FOR USE IN SCAN TESTING

A CIRCUIT FOR USE IN SCAN TESTING

An integrated circuit or die comprising: a first input pad configured to receive an input, said first input pad input comprises scan data multiplexed with a clock signal; a scan chain configured to receive said scan data and said clock signal, a circuit provided between said first input pad and said...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: MORTON, GARY
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:An integrated circuit or die comprising: a first input pad configured to receive an input, said first input pad input comprises scan data multiplexed with a clock signal; a scan chain configured to receive said scan data and said clock signal, a circuit provided between said first input pad and said scan chain configured to provide from said input a first output and a second output, said first output providing said scan data and said second output providing said clock signal.