CROWD-SOURCED HARDWARE CALIBRATION

Systems and methods for calibrating multiple electronic devices are described herein. Such methods may include obtaining, by a processor, data from a plurality of reference electronic devices, analyzing, by a processor, the data and calibrating, by the processor, the electronic device based on the a...

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Bibliographische Detailangaben
Hauptverfasser:	RUBENSTEIN, YONATAN B, SOLOMON, PETER R, RUBENSTEIN, ERIC P, KESSLER, JOSHUA C, DRUKIER, GORDON A, WOJTOWICZ, MAREK A
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Systems and methods for calibrating multiple electronic devices are described herein. Such methods may include obtaining, by a processor, data from a plurality of reference electronic devices, analyzing, by a processor, the data and calibrating, by the processor, the electronic device based on the analyzed data obtained from the plurality of reference electronic devices.