Systems and methods for X-ray diffraction

An x-ray diffraction system (100) includes an x-ray source (102) having a first interchangeable x-ray generating component (104), a second interchangeable x-ray generating component (106), an actuator (108) and a controller (110) operatively connected to the actuator. The first and second interchang...

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Bibliographische Detailangaben
Hauptverfasser: Cernatescu, Iuliana, Furrer, David U
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:An x-ray diffraction system (100) includes an x-ray source (102) having a first interchangeable x-ray generating component (104), a second interchangeable x-ray generating component (106), an actuator (108) and a controller (110) operatively connected to the actuator. The first and second interchangeable x-ray generating components (104, 106) are interchangeable with one another. The actuator (110) is operatively connected to the first and second interchangeable x-ray generating components (104, 106). A method for non-destructive x-ray diffraction includes emitting a first x-ray beam from an x-ray source with a first x-ray generating component based on a first desired depth to measure a crystallographic signature of a sample at the first desired depth, interchanging the first x-ray generating component (104) with a second x-ray generating component (106) to form a modified x-ray source, and emitting a second x-ray beam from the modified x-ray source based on a second desired depth, to non-destructively measure a crystallographic signature of the sample at the second desired depth.