Method of detecting arcs in a plasma process and power supply for supplying an output quantity to a plasma process

In a Method of detecting arcs in a plasma process which is supplied by a power supply (1) with an output quantity (Uout, Iout, Pout), wherein the output quantity (Uout, Iout, Pout) is compared with an arc detection threshold value (Iarc_thres, Uarc_thres) and an arc is detected if the output quantit...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Gieraltowski, Andrzej, Dr Zelechowski, Marcin, Lach, Piotr, Kolasinski, Piotr
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In a Method of detecting arcs in a plasma process which is supplied by a power supply (1) with an output quantity (Uout, Iout, Pout), wherein the output quantity (Uout, Iout, Pout) is compared with an arc detection threshold value (Iarc_thres, Uarc_thres) and an arc is detected if the output quantity (Uout, Iout, Pout) passes the arc detection threshold value (Iarc_thres, Uarc_thres), wherein the arc detection therehold value (Iarc_thres, Uarc_thres) is determined based on at least one set point (Iset, Uset, Pset) for an output quantity.