System and method for testing a material system

A system and method for testing a material system may include a support structure for mounting the material system, and a electromechanical device operably connected to the support structure, wherein the electromechanical device applies an electromechanical-induced force to the material system, and...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Morgan, Jeffrey D, Drexler, Julie M, Mittleider, John A, Greegor, Robert B, Le, Quynhgiao N
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A system and method for testing a material system may include a support structure for mounting the material system, and a electromechanical device operably connected to the support structure, wherein the electromechanical device applies an electromechanical-induced force to the material system, and wherein the electromechanical-induced force causes a displacement in the material system equivalent to material displacement from thermal stress in significantly less time.