III-V NANOWIRE FIELD EFFECT TRANSISTORS WITH CONFORMAL METAL GATE ELECTRODE AND NITROGEN DOPING OF GATE DIELECTRIC INTERFACE
A high-k gate dielectric interface with a group III-V semiconductor surface of a non-planar transistor channel region is non-directionally doped with nitrogen. In nanowire embodiments, a non-directional nitrogen doping of a high-k gate dielectric interface is performed before or concurrently with a...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | CLENDENNING, Scott B THEN, Han Wui RADOSAVLJEVIC, Marko DEWEY, Gilbert PILLARISETTY, Ravi CHAU, Robert S |
description | A high-k gate dielectric interface with a group III-V semiconductor surface of a non-planar transistor channel region is non-directionally doped with nitrogen. In nanowire embodiments, a non-directional nitrogen doping of a high-k gate dielectric interface is performed before or concurrently with a conformal gate electrode deposition through exposure of the gate dielectric to liquid, vapor, gaseous, plasma, or solid state sources of nitrogen. In embodiments, a gate electrode metal is conformally deposited over the gate dielectric and an anneal is performed to uniformly accumulate nitrogen within the gate dielectric along the non-planar III-V semiconductor interface. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP2901491B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP2901491B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP2901491B13</originalsourceid><addsrcrecordid>eNqNyjEOgkAQhWEaC6PeYS5AImpDue7OwCQwS5YJlISYtTJKgqWHlwQPYPP-V3zb5MPMaQdixPccEIixcoBEaBU0GGm5VR9a6FlLsF7Ih9pUUKMuWxhFwGqxwTsEIw6El1-ggPMNSwGeVuV4dWyBRTGQsbhPNvfxMcfDr7sECNWWaZxeQ5yn8Raf8T1gc8qP2SXPrtn5D_IF5tA6YA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>III-V NANOWIRE FIELD EFFECT TRANSISTORS WITH CONFORMAL METAL GATE ELECTRODE AND NITROGEN DOPING OF GATE DIELECTRIC INTERFACE</title><source>esp@cenet</source><creator>CLENDENNING, Scott B ; THEN, Han Wui ; RADOSAVLJEVIC, Marko ; DEWEY, Gilbert ; PILLARISETTY, Ravi ; CHAU, Robert S</creator><creatorcontrib>CLENDENNING, Scott B ; THEN, Han Wui ; RADOSAVLJEVIC, Marko ; DEWEY, Gilbert ; PILLARISETTY, Ravi ; CHAU, Robert S</creatorcontrib><description>A high-k gate dielectric interface with a group III-V semiconductor surface of a non-planar transistor channel region is non-directionally doped with nitrogen. In nanowire embodiments, a non-directional nitrogen doping of a high-k gate dielectric interface is performed before or concurrently with a conformal gate electrode deposition through exposure of the gate dielectric to liquid, vapor, gaseous, plasma, or solid state sources of nitrogen. In embodiments, a gate electrode metal is conformally deposited over the gate dielectric and an anneal is performed to uniformly accumulate nitrogen within the gate dielectric along the non-planar III-V semiconductor interface.</description><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES ; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES ; NANOTECHNOLOGY ; PERFORMING OPERATIONS ; SEMICONDUCTOR DEVICES ; SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES ; TRANSPORTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220928&DB=EPODOC&CC=EP&NR=2901491B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220928&DB=EPODOC&CC=EP&NR=2901491B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CLENDENNING, Scott B</creatorcontrib><creatorcontrib>THEN, Han Wui</creatorcontrib><creatorcontrib>RADOSAVLJEVIC, Marko</creatorcontrib><creatorcontrib>DEWEY, Gilbert</creatorcontrib><creatorcontrib>PILLARISETTY, Ravi</creatorcontrib><creatorcontrib>CHAU, Robert S</creatorcontrib><title>III-V NANOWIRE FIELD EFFECT TRANSISTORS WITH CONFORMAL METAL GATE ELECTRODE AND NITROGEN DOPING OF GATE DIELECTRIC INTERFACE</title><description>A high-k gate dielectric interface with a group III-V semiconductor surface of a non-planar transistor channel region is non-directionally doped with nitrogen. In nanowire embodiments, a non-directional nitrogen doping of a high-k gate dielectric interface is performed before or concurrently with a conformal gate electrode deposition through exposure of the gate dielectric to liquid, vapor, gaseous, plasma, or solid state sources of nitrogen. In embodiments, a gate electrode metal is conformally deposited over the gate dielectric and an anneal is performed to uniformly accumulate nitrogen within the gate dielectric along the non-planar III-V semiconductor interface.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</subject><subject>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</subject><subject>NANOTECHNOLOGY</subject><subject>PERFORMING OPERATIONS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjEOgkAQhWEaC6PeYS5AImpDue7OwCQwS5YJlISYtTJKgqWHlwQPYPP-V3zb5MPMaQdixPccEIixcoBEaBU0GGm5VR9a6FlLsF7Ih9pUUKMuWxhFwGqxwTsEIw6El1-ggPMNSwGeVuV4dWyBRTGQsbhPNvfxMcfDr7sECNWWaZxeQ5yn8Raf8T1gc8qP2SXPrtn5D_IF5tA6YA</recordid><startdate>20220928</startdate><enddate>20220928</enddate><creator>CLENDENNING, Scott B</creator><creator>THEN, Han Wui</creator><creator>RADOSAVLJEVIC, Marko</creator><creator>DEWEY, Gilbert</creator><creator>PILLARISETTY, Ravi</creator><creator>CHAU, Robert S</creator><scope>EVB</scope></search><sort><creationdate>20220928</creationdate><title>III-V NANOWIRE FIELD EFFECT TRANSISTORS WITH CONFORMAL METAL GATE ELECTRODE AND NITROGEN DOPING OF GATE DIELECTRIC INTERFACE</title><author>CLENDENNING, Scott B ; THEN, Han Wui ; RADOSAVLJEVIC, Marko ; DEWEY, Gilbert ; PILLARISETTY, Ravi ; CHAU, Robert S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP2901491B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2022</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</topic><topic>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</topic><topic>NANOTECHNOLOGY</topic><topic>PERFORMING OPERATIONS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CLENDENNING, Scott B</creatorcontrib><creatorcontrib>THEN, Han Wui</creatorcontrib><creatorcontrib>RADOSAVLJEVIC, Marko</creatorcontrib><creatorcontrib>DEWEY, Gilbert</creatorcontrib><creatorcontrib>PILLARISETTY, Ravi</creatorcontrib><creatorcontrib>CHAU, Robert S</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CLENDENNING, Scott B</au><au>THEN, Han Wui</au><au>RADOSAVLJEVIC, Marko</au><au>DEWEY, Gilbert</au><au>PILLARISETTY, Ravi</au><au>CHAU, Robert S</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>III-V NANOWIRE FIELD EFFECT TRANSISTORS WITH CONFORMAL METAL GATE ELECTRODE AND NITROGEN DOPING OF GATE DIELECTRIC INTERFACE</title><date>2022-09-28</date><risdate>2022</risdate><abstract>A high-k gate dielectric interface with a group III-V semiconductor surface of a non-planar transistor channel region is non-directionally doped with nitrogen. In nanowire embodiments, a non-directional nitrogen doping of a high-k gate dielectric interface is performed before or concurrently with a conformal gate electrode deposition through exposure of the gate dielectric to liquid, vapor, gaseous, plasma, or solid state sources of nitrogen. In embodiments, a gate electrode metal is conformally deposited over the gate dielectric and an anneal is performed to uniformly accumulate nitrogen within the gate dielectric along the non-planar III-V semiconductor interface.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng ; fre ; ger |
recordid | cdi_epo_espacenet_EP2901491B1 |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES NANOTECHNOLOGY PERFORMING OPERATIONS SEMICONDUCTOR DEVICES SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TRANSPORTING |
title | III-V NANOWIRE FIELD EFFECT TRANSISTORS WITH CONFORMAL METAL GATE ELECTRODE AND NITROGEN DOPING OF GATE DIELECTRIC INTERFACE |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T14%3A27%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CLENDENNING,%20Scott%20B&rft.date=2022-09-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP2901491B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |