MEASURING METHOD

A diffractive optical element (50) with a substrate (52) and a diffractive structure pattern (54) arranged thereon. The diffractive structure pattern is configured to convert a plane or spherical input wave (42) radiated thereon into at least four separate output waves, wherein at least one of the o...

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Bibliographische Detailangaben
1. Verfasser:	HETZLER, Jochen
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	A diffractive optical element (50) with a substrate (52) and a diffractive structure pattern (54) arranged thereon. The diffractive structure pattern is configured to convert a plane or spherical input wave (42) radiated thereon into at least four separate output waves, wherein at least one of the output waves is a non-spherical wave (56), at least a further one of the output waves is a spherical wave (58; 70) and at least two further ones of the output waves respectively are a plane wave (60) or a spherical wave (72, 74).