Methods and systems for non-destructive inspection comprising a position determination

Disclosed non-destructive inspection methods (100) comprise non-contact determination of the location (101) of a non-destructive inspection probe (30) and identification of the location on a test structure (20) where test data is acquired by the probe (30). Determination may include capturing the po...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: PUCKETT, EDWARD L, SAVOL, ANDREJ M
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Disclosed non-destructive inspection methods (100) comprise non-contact determination of the location (101) of a non-destructive inspection probe (30) and identification of the location on a test structure (20) where test data is acquired by the probe (30). Determination may include capturing the positions of the probe (30) and the test structure (20) with one or more electronic cameras. Identification may include associating (104) the acquired test data with the location of the probe (30) relative to the test structure (20). Further, methods may comprise visualization (106) of the test data relative to the identified location (104). Disclosed non-destructive inspection systems (10) comprise a probe (30), one or more electronic cameras, a computer (44), and a display (42), together configured to determine the location (101) of the probe (30), to acquire test data with the probe (30), to identify a location on a test structure (20) associated with the test data, and to visualize (106) the test data in relation to the test structure (20).