MEASUREMENT DEVICE, SYSTEM AND METHOD

A measurement device (120) includes a light director and a spatial light modulator (130). The light director is disposed to direct light to the spatial light modulator (130) and the spatial light modulator (130) is disposed to receive light from the light director and to modulate it to form an inten...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: HUGHES, EDWARD BENJAMIN, WARDEN, MATTHEW STUART
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:A measurement device (120) includes a light director and a spatial light modulator (130). The light director is disposed to direct light to the spatial light modulator (130) and the spatial light modulator (130) is disposed to receive light from the light director and to modulate it to form an intensity pattern. An optical element is disposed to receive light which formed the intensity pattern and is arranged to magnify the intensity pattern into a measurement space. A detector (142) is disposed to detect light reflected from the measurement space.