SAMPLE FIXING MEMBER FOR TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETER

Provided is a sample fixing member for a time-of-flight secondary ion mass spectrometer that: can prevent the contamination of a solid sample; can stably fix the solid sample; and enables accurate detection of a secondary ion in a time-of-flight secondary ion mass spectrometer. A sample fixing membe...

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Bibliographische Detailangaben
1. Verfasser:	MAENO, YOUHEI
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS CHEMISTRY COMPOUNDS THEREOF ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INORGANIC CHEMISTRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING METALLURGY NON-METALLIC ELEMENTS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Provided is a sample fixing member for a time-of-flight secondary ion mass spectrometer that: can prevent the contamination of a solid sample; can stably fix the solid sample; and enables accurate detection of a secondary ion in a time-of-flight secondary ion mass spectrometer. A sample fixing member for a time-of-flight secondary ion mass spectrometer of the present invention includes a fibrous columnar structure including a plurality of fibrous columnar objects each having a length of 200 µm or more.