TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE

A method for positioning a sample within a chamber (102) of a multi-instrument assembly (100), including positioning a sample on a sample stage surface (208); orienting the sample on the sample stage surface (208) to a first orientation in the chamber (102) coincident with one or more working region...

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Bibliographische Detailangaben
Hauptverfasser:	FENG, YUXIN, MAJOR, RYAN, RASUGU, DEREK, ASIF, SYED AMANULLA SYED, CYRANKOWSKI, EDWARD
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY GAMMA RAY OR X-RAY MICROSCOPES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES IRRADIATION DEVICES MEASURING NUCLEAR ENGINEERING NUCLEAR PHYSICS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING
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Beschreibung
Zusammenfassung:	A method for positioning a sample within a chamber (102) of a multi-instrument assembly (100), including positioning a sample on a sample stage surface (208); orienting the sample on the sample stage surface (208) to a first orientation in the chamber (102) coincident with one or more working regions of one or more instruments within the chamber (102), including a mechanical testing instrument (114), wherein the one or more working regions define a localized coincidence region (222) within the chamber (102), and the sample in the first orientation is within the localized coincidence region (222), wherein orienting includes one or more of: tilting a tilt stage (602) coupled with the sample stage surface (208), or rotating a rotation stage (600) coupled with the sample stage surface (208); and reorienting the sample on the sample stage surface (208) to a second orientation in the chamber (102) coincident with one or more working regions of the one or more instruments, wherein the second orientation is different from the first orientation, and the sample in the second orientation is within the localized coincidence region (222), wherein reorienting includes one or more of tilting the tilt stage (602) or rotating the rotation stage (600).