Contact spring for a test socket for the high power testing of an electronic component

The contact spring (3) has opposing lateral faces, spring arm and a testing arm with a testing tip. The testing arm forms an angle with the spring arm. The distance between the points on the lateral faces is set less than or equal to 2.3 times the spring length. The distance from the testing tip to...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	GSCHWENDTBERGER, GERHARD, LEIKERMOSER, VOLKER, FREY, MARCUS, PETERMANN, MANUEL
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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