METHOD OF SEARCHING FOR PARAMETERIZED CONTOURS FOR COMPARING IRISES

A method for detecting outlines for iris comparison comprises a step of selecting N candidate outlines of circular form by applying a circle search technique to an image of edges of an iris. It also comprises a step of optimizing the form and the position of the N candidate outlines, the optimized c...

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Hauptverfasser:	LEFEVRE, THIERRY, DORIZZI, BERNADETTE, GARCIA, SONIA, LEMPERIERE, NADEGE
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING HANDLING RECORD CARRIERS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS PRESENTATION OF DATA RECOGNITION OF DATA RECORD CARRIERS
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Beschreibung
Zusammenfassung:	A method for detecting outlines for iris comparison comprises a step of selecting N candidate outlines of circular form by applying a circle search technique to an image of edges of an iris. It also comprises a step of optimizing the form and the position of the N candidate outlines, the optimized candidate outlines being determined by using parametric models, a set of parameters being determined for each candidate outline by minimizing a quantity of energy E(C). The method also comprises a step of selecting the best optimized candidate outline.