CALIBRATING DEVICE PERFORMANCE WITHIN AN INTEGRATED CIRCUIT

A multi-fingered device can be calibrated for performance. The multi-fingered device can include a first finger configured to remain active and a second finger that is initially deactivated concurrent with the first finger being active. A measure of degradation for the multi-fingered device within a...

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Bibliographische Detailangaben
Hauptverfasser:	SADOUGHI, SHARMIN, AHN, JAE-GYUNG
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS BASIC ELECTRONIC CIRCUITRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	A multi-fingered device can be calibrated for performance. The multi-fingered device can include a first finger configured to remain active and a second finger that is initially deactivated concurrent with the first finger being active. A measure of degradation for the multi-fingered device within an IC can be determined. The measure of degradation can be compared with a degradation threshold. Responsive to determining that the measure of degradation meets the degradation threshold, a finger of the multi-fingered device can be activated.