SYSTEM TO DETECT FAILED PIXELS IN A SENSOR ARRAY

A system to test operation of an optical sensor (50) is disclosed. The optical sensor (50) includes one or more photosensitive devices (80) configured to convert light to electrical signals. A test light source (60) is included within the housing (52) of the optical sensor (50). The test light sourc...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Grinberg, Anatoly G, Foster, Wayne R
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A system to test operation of an optical sensor (50) is disclosed. The optical sensor (50) includes one or more photosensitive devices (80) configured to convert light to electrical signals. A test light source (60) is included within the housing (52) of the optical sensor (50). The test light source (60) is periodically pulsed on to emit radiation (62) at a sufficient intensity to saturate each of the photosensitive devices (80). Each of the photosensitive devices (80) generates a signal corresponding to the intensity of light (62) detected at that device (80). A logic circuit uses the signals corresponding to the intensity of light to identify whether each of the photosensitive devices (80) is performing at an acceptable level.