Apparatus and method for calibrating laser projection system

In an embodiment of the disclosure, there is provided an apparatus for calibrating a laser projection system (120, 228). The apparatus has a structural frame assembly (201, 301) extending along three mutually orthogonal axes (170). The apparatus further has a plurality of non-movable reflective targ...

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Bibliographische Detailangaben
Hauptverfasser:	BOLLINGER, BRIAN A, ASHFORD, CURTIS M
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	In an embodiment of the disclosure, there is provided an apparatus for calibrating a laser projection system (120, 228). The apparatus has a structural frame assembly (201, 301) extending along three mutually orthogonal axes (170). The apparatus further has a plurality of non-movable reflective targets (108, 238) disposed on the structural frame assembly (201, 301). The apparatus further has at least three positioning stages (112) coupled to the structural frame assembly (201, 301) respectively about each of the three mutually orthogonal axes (170). At least one movable reflective target (114) is disposed on each positioning stage (112). The non-movable reflective targets (108, 238) and the at least one movable reflective target (114) are each configured to reflect a laser beam from a laser projection system (180, 228).