Ultrasonic modeling for inspection of composite irregularities

A first simulated inspection is conducted to provide a first waveform data set associated with the at least one irregularity (270, 450) parameter. The first simulated inspection is conducted using a first evaluation setting. A first image (572) is produced based on the first waveform set, and it is...

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Bibliographische Detailangaben
Hauptverfasser:	Lin, John Z, Bossi, Richard H, Tat, Hong
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A first simulated inspection is conducted to provide a first waveform data set associated with the at least one irregularity (270, 450) parameter. The first simulated inspection is conducted using a first evaluation setting. A first image (572) is produced based on the first waveform set, and it is determined whether a quality of the first image (572) satisfies a predetermined threshold.