DEVICE AND METHOD FOR SIMULTANEOUSLY PRECIPITATING A PLURALITY OF SEMICONDUCTOR LAYERS IN A PLURALITY OF PROCESS CHAMBERS
A method for depositing a semiconductor layer on a multiplicity of substrates. The process chamber height (H), which is defined by the spacing between a process chamber ceiling (8) and a process chamber floor (9) is variable and influences the growth rate of the layer. The layer thickness is measure...
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Sprache: | eng ; fre ; ger |
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