Sampler for taking samples of melts with a melt point higher than 600°C and sampling method

The sampling device comprises a carrier tube (1) with an immersion end and a sampling chamber arrangement with an inlet opening and a sampling space (9) for the melted mass. The sampling chamber arrangement is arranged partially in the interior of the carrier tube. The sampling chamber arrangement c...

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Bibliographische Detailangaben
Hauptverfasser:	Song, Lihuan, Neyens, Guido, Jacobus, Broekmans, Gerrit, Beyens, Dries
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	The sampling device comprises a carrier tube (1) with an immersion end and a sampling chamber arrangement with an inlet opening and a sampling space (9) for the melted mass. The sampling chamber arrangement is arranged partially in the interior of the carrier tube. The sampling chamber arrangement comprises a coupling device (14) arranged at a part of its outer surface inside the carrier tube for coupling the carrier lance. The sampling chamber arrangement has an inner wall for the sampling chamber and an outer wall (12,12'). Independent claims are included for the following: (1) a sampling chamber arrangement for a sampling device; and (2) a method for sampling of melted mass with a melting temperature of greater than 600 degree Celsius, particularly for metal or cryolite melts with a sampling device.