METHODS FOR ASSESSING A TEMPERATURE IN A SUBSURFACE FORMATION

Methods for assessing a temperature in an opening in a subsurface formation are described herein. A method may include assessing one or more dielectric properties along a length of an insulated conductor located in the opening and assessing one or more temperatures along the length of the insulated...

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Bibliographische Detailangaben
Hauptverfasser: NGUYEN, Scott Vinh, DE ST. REMEY, Edward Everett, THOMPSON, Stephen Taylor, ARORA, Dhruv, BASS, Ronald Marshall, GESUALDI, Eric Abreu, BURNS, David Booth
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:Methods for assessing a temperature in an opening in a subsurface formation are described herein. A method may include assessing one or more dielectric properties along a length of an insulated conductor located in the opening and assessing one or more temperatures along the length of the insulated conductor based on the one or more assessed dielectric properties.