SYSTEM FOR MECHANICAL CHARACTERIZATION OF MATERIALS AND BIOLOGICAL SAMPLES IN THE SUB-MILLINEWTON FORCE RANGE

The mechanical characterization system includes three main parts: A sub-millinewton resolution capacitive force sensor, at least one micromanipulator with position measurement capabilities, and a microscope. The sensitive axis of the force sensor is adjustably connected via adaptor pieces to the mic...

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Bibliographische Detailangaben
Hauptverfasser:	MUNTWYLER, Simon, BEYELER, Felix
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MICROSTRUCTURAL TECHNOLOGY OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PERFORMING OPERATIONS PHYSICS PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTUREOR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING TRANSPORTING
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Beschreibung
Zusammenfassung:	The mechanical characterization system includes three main parts: A sub-millinewton resolution capacitive force sensor, at least one micromanipulator with position measurement capabilities, and a microscope. The sensitive axis of the force sensor is adjustably connected via adaptor pieces to the micromanipulator at any angular orientation relative to the sample holder.