Sensor probe and method of assembling a sensor probe

A sensor probe (202) for use in a sensor assembly (110) is provided. The sensor probe includes an emitter (206) configured to generate at least one forward propagating electromagnetic field (224) from at least one microwave signal and to generate at least one backward propagating electromagnetic fie...

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Bibliographische Detailangaben
Hauptverfasser:	SHEIKMAN, BORIS LEONID, LEE, YONGJAE
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC ORINFRASONIC WAVES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A sensor probe (202) for use in a sensor assembly (110) is provided. The sensor probe includes an emitter (206) configured to generate at least one forward propagating electromagnetic field (224) from at least one microwave signal and to generate at least one backward propagating electromagnetic field (228), a data conduit (204) coupled to the emitter; and a ground conductor (323) extending substantially circumferentially about the data conduit (204), the ground conductor configured to substantially reduce electromagnetic radiation within the sensor assembly.