Diagnostic system and method for a thermistor amplifier circuit

A diagnostic system (40) and a diagnostic method for a thermistor amplifier circuit (30) are provided. The system includes a transistor (100) electrically coupled to a controllable variable resistor (102) having a predetermined resistance. The transistor (100) applies a test voltage signal to the ci...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Williams, Craig Benjamin, Vicente, Nataniel Barbosa, Greenwood, Todd Elliott
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A diagnostic system (40) and a diagnostic method for a thermistor amplifier circuit (30) are provided. The system includes a transistor (100) electrically coupled to a controllable variable resistor (102) having a predetermined resistance. The transistor (100) applies a test voltage signal to the circuit indicative of a first temperature value. An amplitude of the test voltage value is indicative of a simulated thermistor temperature value. The microprocessor (190) determines a test temperature value based on the amplitude of an output voltage of the circuit (30). The microprocessor (190) also determines an inaccuracy value based on the test temperature value and the simulated thermistor temperature value.