SYSTEM AND METHOD FOR MEASURING CAPACITANCE
A system and method for testing capacitance of a load circuit connected to an output pin of a driving circuit. In one embodiment, the method may comprise driving a voltage at the output pin to a first voltage; a predetermined current to the output pin; comparing the voltage at the output pin to a re...
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| Format: | Patent |
| Sprache: | eng ; fre ; ger |
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| Zusammenfassung: | A system and method for testing capacitance of a load circuit connected to an output pin of a driving circuit. In one embodiment, the method may comprise driving a voltage at the output pin to a first voltage; a predetermined current to the output pin; comparing the voltage at the output pin to a reference voltage; and when the voltage at the output pin matches the reference voltage, generating an estimate of capacitance present at the output pin based on a number of clock cycles occurring between an onset of a timed voltage change period and a time at which the voltage at the output pin matches the reference voltage. |
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