Sensor assembly and methods of measuring a proximity of a machine component to a sensor

Sensor assembly and methods of measuring a proximity of a machine component to a sensor

A sensor assembly (110) for use in monitoring a machine component (104) includes a signal processing device (200) and at least one probe (202). The at least one probe includes an emitter (206) configured to generate an electromagnetic field from at least one microwave signal, wherein the emitter is...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: JENSEN, RAYMOND, SHEIKMAN, BORIS LEONID
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A sensor assembly (110) for use in monitoring a machine component (104) includes a signal processing device (200) and at least one probe (202). The at least one probe includes an emitter (206) configured to generate an electromagnetic field from at least one microwave signal, wherein the emitter is detuned when a machine component is positioned within the electromagnetic field such that a loading signal is generated. The at least one probe also includes a transmitter (210) coupled to the emitter and configured to wirelessly transmit the loading signal to the signal processing device.