Method for filtering measurement signals in non-destructive material testing

The invention relates to a method for filtering measurement signals by way of wavelet filtering, wherein the signals are first transferred to the wavelet domain by way of a wavelet transform, are subjected to threshold analysis, and the threshold values can then be varied in the wavelet domain comme...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MÜLLER, Klaus-Dieter, NITSCHE, Stefan, SCHMITTE, Till, ORTH, Thomas
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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