Method for filtering measurement signals in non-destructive material testing

Method for filtering measurement signals in non-destructive material testing

The invention relates to a method for filtering measurement signals by way of wavelet filtering, wherein the signals are first transferred to the wavelet domain by way of a wavelet transform, are subjected to threshold analysis, and the threshold values can then be varied in the wavelet domain comme...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MÜLLER, Klaus-Dieter, NITSCHE, Stefan, SCHMITTE, Till, ORTH, Thomas
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:The invention relates to a method for filtering measurement signals by way of wavelet filtering, wherein the signals are first transferred to the wavelet domain by way of a wavelet transform, are subjected to threshold analysis, and the threshold values can then be varied in the wavelet domain commensurate with the respective measurement situation. The measurement signals are filtered by a plurality of filters arranged in segmentation levels and a statistical parameter is calculated based on an adjustable number of already calculated wavelet coefficients of a segmentation level and is then multiplied with a value that can be adjusted.