DETECTION OF DEFECTS IN AN ELECTROCHEMICAL DEVICE

A method for detecting defects in an electrochemical device, including obtaining at least one characteristic value dependent on at least one variable received from the electrochemical device and determining at least one defect in said device from the characteristic value obtained. The method compris...

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Bibliographische Detailangaben
Hauptverfasser:	YOUSFI-STEINER, NADIA, MOCOTEGUY, PHILIPPE, HISSEL, DANIEL, CANDUSSO, DENIS, GAUTIER, LUDMILA
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING CAPACITORS CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY TESTING
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Beschreibung
Zusammenfassung:	A method for detecting defects in an electrochemical device, including obtaining at least one characteristic value dependent on at least one variable received from the electrochemical device and determining at least one defect in said device from the characteristic value obtained. The method comprises a mathematical operation including a wavelet transform, which operation is carried out in order to obtain the characteristic value from the variable received. The invention also relates to a device that carries out one such method, as well as to a corresponding computer program.