DRY COATING THICKNESS MEASUREMENT AND INSTRUMENT

Instruments for measuring and/or controlling the thickness of a coating applied to a substrate are provided. Methods for measuring the dry thickness of the coating utilizing instruments of the invention are also provided.

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Bibliographische Detailangaben
1. Verfasser: Bucher, Udo Wolfgang
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
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Beschreibung
Zusammenfassung:Instruments for measuring and/or controlling the thickness of a coating applied to a substrate are provided. Methods for measuring the dry thickness of the coating utilizing instruments of the invention are also provided.