Position measuring system and assembly method

The system has a measurement partition with a carrier (11) mounted at a machine part, and a scanning head (2) for scanning the measurement partition mounted at another machine part. Adjustment devices (4, 5) are formed between portions (31, 33) of assembly aids (3) such that a mounting position betw...

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Bibliographische Detailangaben
Hauptverfasser:	Kühler, Markus, Pucher, Wolfgang
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The system has a measurement partition with a carrier (11) mounted at a machine part, and a scanning head (2) for scanning the measurement partition mounted at another machine part. Adjustment devices (4, 5) are formed between portions (31, 33) of assembly aids (3) such that a mounting position between the carrier of the measurement partition and the scanning head is adjusted in one degree of freedom (Y), which deviates from a measuring direction. One of the adjustment devices is formed such that a linear adjustable movement is enabled. An independent claim is also included for a method for assembling a carrier of a measurement partition and a scanning head of a position measuring system to two machine parts.