System for determining representative positions for sampled features
In the case of collecting samples, it is difficult to select a representative point of a target area. Thus, the samples are collected from certain positions, resulting in generation of variations of data. The target area is specified on an image to extract features from the target area. Further, clu...
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| Format: | Patent |
| Sprache: | eng ; fre ; ger |
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| Zusammenfassung: | In the case of collecting samples, it is difficult to select a representative point of a target area. Thus, the samples are collected from certain positions, resulting in generation of variations of data. The target area is specified on an image to extract features from the target area. Further, clustering is performed for the features on a feature space to obtain representative features, and the obtained representative features are extracted as sampling points. |
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