Test and measurement device, system, and method for providing synchronized measurement views

Embodiments of the invention include a test and measurement device, system, and method for synchronizing measurement views and configuration parameters across multiple input channels or devices. A method includes receiving signals under test associated with multiple input channels of the test and me...

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Bibliographische Detailangaben
Hauptverfasser: OVERTON, MICHAEL S, IVERS, KEVIN T, MELLING JR., LAURENT A, ZHU, XINYU, MCKIBBEN, BARRY A
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:Embodiments of the invention include a test and measurement device, system, and method for synchronizing measurement views and configuration parameters across multiple input channels or devices. A method includes receiving signals under test associated with multiple input channels of the test and measurement instrument or with multiple devices, selecting a measurement view of one input signal or device, receiving a synchronized view enable preference from a user control interface, and synchronizing the measurement view or configuration parameters of the other signals or devices with what was chosen on the first signal or device. A test and measurement instrument includes input terminals to receive the input signals, a user control interface to receive input from an operator, a display to provide measurement information about the input signals, and a synchronization control unit to synchronize measurement views and/or configuration parameters between the inputs or devices.