DIP-based corrections for data reconstruction in three-dimensional surface-related multiple prediction

DIP-based corrections for data reconstruction in three-dimensional surface-related multiple prediction

A best fitting trace in seismic data is determined for a desired trace to be reconstructed. A dip-based correction is calculated per trace and per sample for differences in azimuth, common midpoint coordinates, and offset between the best fitting trace and the desired trace. The dip-based correction...

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Bibliographische Detailangaben
Hauptverfasser: HEGGE, ROBERTUS F, BARNES, SIMON R, AARON, PETER A, VAN BORSELEN, ROALD G
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
DETECTING MASSES OR OBJECTS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A best fitting trace in seismic data is determined for a desired trace to be reconstructed. A dip-based correction is calculated per trace and per sample for differences in azimuth, common midpoint coordinates, and offset between the best fitting trace and the desired trace. The dip-based correction is applied to the best fitting trace to reconstruct the desired trace for 3D surface-related multiple prediction.