Method and apparatus for determination of magnetic system manufacturing defects

Method and apparatus for determination of magnetic system manufacturing defects

A method for determination of characteristic ("typical") defects arising in manufacturing, assembling and mounting a structure being a magnetic field source is proposed. In accordance with the method the magnetic field components are detected at plurality of points around the structure and...

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Bibliographische Detailangaben
Hauptverfasser: EGOROV, SERGEY ALEXANDROVICH, KUKHTIN, VLADIMIR PETROVICH, FILATOV, OLEG GENNADIEVICH, LAMZIN, EVGENIY ANATOLIEVICH, MAXIMENKOVA, NINA ALEXANDROVNA, SYTCHEVSKY, SERGEY EVGENIEVICH, KOROTKOV, VLADIMIR ALEXANDROVICH, IVKIN, VLADIMIR GEORGIEVICH, AMOSKOV, VIKTOR MIKHAILOVICH, VASILIEV, VYACHESLAV NIKOLAEVICH, RODIN, IGOR YURIEVICH, LANTSETOV, ANDREY ANATOLIEVICH, LARIONOV, MIKHAIL SERGEEVICH, SHATIL, NIKOLAY ALEXANDROVICH, BELYAKOV, VALERIY ARKADEVICH, FIRSOV, ALEXEY ANATOLIEVICH
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A method for determination of characteristic ("typical") defects arising in manufacturing, assembling and mounting a structure being a magnetic field source is proposed. In accordance with the method the magnetic field components are detected at plurality of points around the structure and differences of the field components measured in said points from calculated ("ideal") ones are determined. The method characterized in that the system magnetic field is measured, at least one equation connecting measured magnetic field with hypothetical magnetic field of the magnetic system having one or more defects. The hypothetical magnetic field is expressed in the form of dependence on one or more parameters describing said defects. After that the formulated equations are solved by obtaining the parameters describing the defects. An apparatus implementing said method is proposed as well.