Method and system for testing and calibrating an accelerometer of an electronic device

A method and system for testing and calibrating an accelerometer of an electronic device are provided. In accordance with one embodiment, there is method of testing and calibrating an accelerometer of an electronic device, comprising: levelling a test fixture; placing the electronic device in a nest...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	KENNEDY, MARC, ADAM, IVANNIKOV, ARKADY, PAPO, ALEKSANDAR
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT MEASURING MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A method and system for testing and calibrating an accelerometer of an electronic device are provided. In accordance with one embodiment, there is method of testing and calibrating an accelerometer of an electronic device, comprising: levelling a test fixture; placing the electronic device in a nest of the test fixture; detecting the electronic device within the nest; calculating an offset value for each sensing axis of the accelerometer in response to detecting the electronic device within the nest; and storing the offset values in a memory of the electronic device.