PROBE FOR A CAPACITIVE SENSOR DEVICE AND GAP-MEASURING SYSTEM

PROBE FOR A CAPACITIVE SENSOR DEVICE AND GAP-MEASURING SYSTEM

A probe for a capacitive sensor device, and a gap measuring system using the probe, is disclosed. The probe has a probe head including a measuring element with at least one measuring and front face, a first electrically non-conductive isolator element, and a first partial element of a first shield....

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SCHNEIDER, RENE, ECKER, ALFRED, HEIDER, GERHARD
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A probe for a capacitive sensor device, and a gap measuring system using the probe, is disclosed. The probe has a probe head including a measuring element with at least one measuring and front face, a first electrically non-conductive isolator element, and a first partial element of a first shield. The measuring and front face, the first isolator element, and the first partial element of the first shield are adhesively connected to one another and configured as a multilayer, where the first isolator element is disposed between the measuring element with its measuring and front face and the first partial element.