Specimen analyzing apparatus and specimen analyzing method

A specimen analyzing apparatus comprising: a detector for detecting component information regarding a component in a specimen contained in each of analyzing containers, the analyzing containers comprising first and second analyzing containers; an analyzing part for analyzing the component informatio...

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Bibliographische Detailangaben
Hauptverfasser: Koike, Hiroki, Ikeda, Masayuki, Fukuda, Kazuya, Imazu, Masanori, Nakano, Daisuke, Katsumi, Hironori, Yamato, Takashi, Kitagawa, Nobuhiro, Fukuzaki, Tsuyoshi
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:A specimen analyzing apparatus comprising: a detector for detecting component information regarding a component in a specimen contained in each of analyzing containers, the analyzing containers comprising first and second analyzing containers; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting specimen containers each containing a specimen, the specimen containers comprising first and second specimen containers; an operation mode selecting means for selecting one of a first operation mode and a second operation mode; a first supplying device for supplying the specimen of a first amount; a second supplying device for supplying the specimen of a second amount grater than the first amount; and a supply controlling means for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selecting means, is disclosed. A specimen analyzing method is also disclosed.