Strain-independent microstructure characterisation
The method involves charging a material with two load voltages of different values. A magnetic field is applied on the material, and a measured variable e.g. magnetic flux density, based on magnetic field strength of the magnetic field is received for each load voltage. A characteristic magnetic fie...
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| Format: | Patent |
| Sprache: | eng ; fre ; ger |
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| Zusammenfassung: | The method involves charging a material with two load voltages of different values. A magnetic field is applied on the material, and a measured variable e.g. magnetic flux density, based on magnetic field strength of the magnetic field is received for each load voltage. A characteristic magnetic field strength is determined. The measured variable, or variables derived from the measured variable and corresponding to the load voltages have the same value. A micro-structure of the material is characterized by the characteristic magnetic field strength and/or the value. Independent claims are also included for the following: (1) a method for comparing micro-structures of two materials (2) a device for characterization of a micro-structure of a material (3) a device for comparing micro-structures of two materials. |
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