Sample holder for analysing a sample at a fixed incidence angle, an ellipsometer comprising such an element and an ellipsometric method for analysing a sample

Bibliographische Detailangaben

Hauptverfasser:	CATTELAN, DENIS, LERONDEAU, CECILE, BOS, FRANCIS
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!