ACCESSORY FOR ATTENUATED TOTAL INTERNAL REFLECTANCE (ATR) SPECTROSCOPY

An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be mounted on the moveable stage (20) of the microscope. A mounting (100) for an ATR crystal is carried on the support. The mounting (100) is preferably pivotally mounted on the support (40) so...

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Bibliographische Detailangaben
Hauptverfasser:	CARTER, Ralph Lance, CANAS WILKINSON, Antonio, STYLES, Paul, HOULT, Robert, Alan
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	An accessory for use with a microscope arranged to carry out ATR measurements has a support (40) which can be mounted on the moveable stage (20) of the microscope. A mounting (100) for an ATR crystal is carried on the support. The mounting (100) is preferably pivotally mounted on the support (40) so that it can be pivoted from a position in which the crystal lines on the axis of the microscope to a position in which a sample on the support can be observed visually. The mounting is arranged such that it can be returned reliably and reproducibly to its original position with the crystal on the axis.