Method and computer program product for defining anisotropy parameters

The method involves determining number of points on an ellipse line, and determining a measuring line for each of points on the ellipse line, where the measuring line cuts the ellipse line in the points. Number of measuring points on each of the measuring lines is determined, and birefringence inten...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SCHIMMING, THOMAS, RINK, KLAUS
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The method involves determining number of points on an ellipse line, and determining a measuring line for each of points on the ellipse line, where the measuring line cuts the ellipse line in the points. Number of measuring points on each of the measuring lines is determined, and birefringence intensity for each of the measuring point is determined. Statistic characteristics of birefringence distribution are calculated from the determined birefringence intensities, where each measuring line comprises same number of measuring points. Independent claims are also included for the following: (1) a computer program product comprising machine readable instructions for performing a method for determining static characteristics of birefringence distribution of an image of a biological cell (2) an arrangement for determining static characteristics of birefringence distribution of an image of a biological cell.